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Inventi Impact: VLSI

Articles

  • Inventi:evs/32219/20
    Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions
    Research 2020 : July - September
    Ygor Q Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D Touboul

    Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event\nTransient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event\nUpset (SEU) effects. However, the importance of considering SET in Very-Large-System-Integration\n(VLSI) circuits increases given the reduction of the transistor dimensions and the logic data path\ndepth in advanced technology nodes.........................

    How to Cite this Article
    Attribution/ CC Compliant Citation: Aguiar, Ygor Q., et al. \"Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions.\" Aerospace 7.2 (2020): 12.\nhttps://doi:10.3390/aerospace7020012\nhttp://creativecommons.org/licenses/by/4.0/\n\nSome formatting elements, header, footer, logos, dates and pagination were modified while adapting this article.
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